Characterizing Spatiotemporal Patterns of Winter Wheat Phenology from 1981 to 2016 in North China by Improving Phenology Estimation
Phenology provides important information for wheat growth management and the estimation of wheat yield and quality. The relative threshold method has been widely used to retrieve phenological metrics from remotely sensed data owing to its simplicity. However, the thresholds vary substantially among...
Gorde:
| Egile Nagusiak: | , , , , , , , |
|---|---|
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
MDPI AG
2022-10-01
|
| Saila: | Remote Sensing |
| Gaiak: | |
| Sarrera elektronikoa: | https://www.mdpi.com/2072-4292/14/19/4930 |
| Etiketak: |
Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!
|