Ultrafast Bragg coherent diffraction imaging of epitaxial thin films using deep complex-valued neural networks

Abstract Domain wall structures form spontaneously due to epitaxial misfit during thin film growth. Imaging the dynamics of domains and domain walls at ultrafast timescales can provide fundamental clues to features that impact electrical transport in electronic devices. Recently, deep learning based...

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Detalhes bibliográficos

Principais autores:	Xi Yu, Longlong Wu, Yuewei Lin, Jiecheng Diao, Jialun Liu, Jörg Hallmann, Ulrike Boesenberg, Wei Lu, Johannes Möller, Markus Scholz, Alexey Zozulya, Anders Madsen, Tadesse Assefa, Emil S. Bozin, Yue Cao, Hoydoo You, Dina Sheyfer, Stephan Rosenkranz, Samuel D. Marks, Paul G. Evans, David A. Keen, Xi He, Ivan Božović, Mark P. M. Dean, Shinjae Yoo, Ian K. Robinson
Formato:	Artigo
Idioma:	Inglês
Publicado em:	Nature Portfolio 2024-01-01
coleção:	npj Computational Materials
Acesso em linha:	https://doi.org/10.1038/s41524-024-01208-7
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