X-ray diffractometric study of HDPE/GaAs and HDPE/GaAs<Te> composites

High-density polyethylene sheets (HDPE), HDPE/GaAs and HDPE/ GaAs<Te>  composites with GaAs and GaAs<Te> semiconductor fillers were studied by X-ray diffractometry at room temperature. The degree of crystallization of these samples was calculated and it was determined that the inclusion of fillers i...

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Bibliografiske detaljer

Principais autores:	N.N. Gadzhieva, G.B. Ahmadova, S.Z. Melikova, F.G. Asadov
Format:	Artigo
Sprog:	Inglês
Udgivet:	Vasyl Stefanyk Carpathian National University 2023-02-01
Serier:	Фізика і хімія твердого тіла
Fag:	high density polyethylene gaas gaas<te> composites x-ray diffractometry method
Online adgang:	https://journals.pnu.edu.ua/index.php/pcss/article/view/6346
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