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Scanning electron microscopic analysis of adherent bacterial biofilms associated with peri‐implantitis

Abstract Objectives Peri‐implantitis (PI) is caused by bacteria in the peri‐implant space but the consensus on microbial profile is still lacking. Current microbial sampling of PI lesions has largely focused on analyzing bacterial species that have been shed from the implant surface and captured in...

Бүрэн тодорхойлолт

-д хадгалсан:
Номзүйн дэлгэрэнгүй
Үндсэн зохиолчид: Jae W. Chang, Jiarui Bi, Gethin Owen, Ya Shen, Markus Haapasalo, Colin Wiebe, Rana Tarzemany, Hannu Larjava
Формат: Artigo
Хэл сонгох:Inglês
Хэвлэсэн: Wiley 2023-08-01
Цуврал:Clinical and Experimental Dental Research
Нөхцлүүд:
Онлайн хандалт:https://doi.org/10.1002/cre2.741
Шошгууд: Шошго нэмэх
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