History and Prospects for the Application of X-Ray Diffraction Analysis in Seed Breeding and Seed Study

Introduction. X-ray analysis has been applied for visualizing the internal structure of various objects for over 100 years. However, this method began to be used for assessing the quality of plant seeds only in the early 1980s. The main impediment was a lack of specialized instruments, particularly...

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Λεπτομέρειες βιβλιογραφικής εγγραφής

Κύριοι συγγραφείς:	F. B. Musaev, S. L. Beletskiy
Μορφή:	Artigo
Γλώσσα:	Russo
Έκδοση:	Saint Petersburg Electrotechnical University "LETI" 2021-12-01
Σειρά:	Известия высших учебных заведений России: Радиоэлектроника
Θέματα:	seeds grain x-ray diffraction analysis seed defects
Διαθέσιμο Online:	https://re.eltech.ru/jour/article/view/574
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