Edge Absorption of (Y<sub>0.06</sub>Ga<sub>0.94</sub>)<sub>2</sub>O<sub>3</sub> Thin Films
<span>Fundamental absorption edge of (Y</span><sub>0.06</sub><span>Ga</span><sub>0.94</sub><span>)</span><sub>2</sub><span>O</span><sub>3</sub><span> thin films, obtained by radio-frequency ion-plasmous sputtering, was investigated using the method of optical spectroscopy. It was established that th...
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| Autors principals: | , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Vasyl Stefanyk Carpathian National University
2018-01-01
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| Col·lecció: | Фізика і хімія твердого тіла |
| Accés en línia: | http://journals.pu.if.ua/index.php/pcss/article/view/2257 |
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