Optical Power Monitoring with Ultrahigh Sensitivity in Silicon Waveguides and Ring Resonators

We demonstrate optical power monitoring using a silicon resistor enabled by the surface and defect states-induced photoconductance effect. Ultrahigh optical power detection sensitivity of −40 dBm under a low AC drive voltage of 5 mV is obtained with the facilitation of a lock-in amplifier cir...

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Hlavní autoři:	Dong Li, Linjie Zhou, Liangjun Lu, Jianping Chen
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	IEEE 2017-01-01
Edice:	IEEE Photonics Journal
Témata:	Silicon nanophotonics waveguide devices Photodetectors waveguides.
On-line přístup:	https://ieeexplore.ieee.org/document/7982749/
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