Deformation and recrystallization texture and microstructure evolution of thin grain-oriented silicon steel sheets
Combined with magnetic property measurements of thin grain-oriented silicon steel sheets annealed to different recrys-tallization stages, the deformation and recrystallization texture and microstructure evolution of the sheets was analyzed by using the electron back-scattering diffraction (EBSD) mic...
Gorde:
| Egile Nagusiak: | , , |
|---|---|
| Formatua: | Artigo |
| Hizkuntza: | Chinês |
| Argitaratua: |
Science Press
2015-01-01
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| Saila: | 工程科学学报 |
| Gaiak: | |
| Sarrera elektronikoa: | http://cje.ustb.edu.cn/article/doi/10.13374/j.issn2095-9389.2015.01.008 |
| Etiketak: |
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