Thickness Effect on Some Physical Properties of RF Sputtered ZnTe Thin Films for Potential Photovoltaic Applications

Zinc telluride thin films with different thicknesses were grown onto glass substrates by the rf magnetron sputtering technique, using time as a variable growth parameter. All other deposition process parameters were kept constant. The deposited thin films with thickness from 75 to 460 nm were charac...

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Xehetasun bibliografikoak

Egile Nagusiak:	Dumitru Manica, Vlad-Andrei Antohe, Antoniu Moldovan, Rovena Pascu, Sorina Iftimie, Lucian Ion, Mirela Petruta Suchea, Ştefan Antohe
Formatua:	Artigo
Hizkuntza:	Inglês
Argitaratua:	MDPI AG 2021-09-01
Saila:	Nanomaterials
Gaiak:	ZnTe thin films rf-magneton sputtering AFM surface metrology thickness effect
Sarrera elektronikoa:	https://www.mdpi.com/2079-4991/11/9/2286
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