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Consumer's Risk in Zero-defect Sampling Inspection of Surveying and Mapping Products

Through theoretical analysis and empirical research, this study thoroughly examines the theoretical foundations and practical applications of zero-defect sampling inspection schemes, revealing significant differences between inspecting large lots as a whole versus splitting them into sub-lots in ter...

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Збережено в:
Бібліографічні деталі
Автори: F. Luo, H. Zhao, J. Liu, X. Wang, C. Chen
Формат: Artigo
Мова:Inglês
Опубліковано: Copernicus Publications 2026-07-01
Серія:ISPRS Annals of the Photogrammetry, Remote Sensing and Spatial Information Sciences
Онлайн доступ:https://isprs-annals.copernicus.org/articles/XI-4-2026/197/2026/isprs-annals-XI-4-2026-197-2026.pdf
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