QR Kod

Reliability evaluation of MMC system considering working conditions

The reliability is a key issue of the high-voltage high-power modular multilevel converter (MMC) system due to the usage of fragile insulated gate bipolar transistor (IGBT) modules. In this study, it is proposed that the reliability of the MMC system can be modelled and calculated considering practi...

Ful tanımlama

Kaydedildi:
Asıl Yazarlar: Tao Zheng, Meng Huang, Lingyi Zhu, Xiaoming Zha
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: Wiley 2018-10-01
Seri Bilgileri:The Journal of Engineering
Konular:
ageing
insulated gate bipolar transistors
voltage-source convertors
HVDC power convertors
failure analysis
reliability
power loss
MMC system failure rate
reliability evaluation
high-voltage high-power modular multilevel converter system
fragile insulated gate bipolar transistor modules
MMC power level
working conditions
junction temperature
temperature coefficient
IGBT aging process
Online Erişim:https://digital-library.theiet.org/content/journals/10.1049/joe.2018.8891
Etiketler: Etiketle
Etiket eklenmemiş, İlk siz ekleyin!

Benzer Materyaller