Correlative X-ray micro-nanotomography with scanning electron microscopy at the Advanced Light Source
Geological samples are inherently multi-scale. Understanding their bulk physical and chemical properties requires characterization down to the nano-scale. A powerful technique to study the three-dimensional microstructure is X-ray tomography, but it lacks information about the chemistry of samples....
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| Autores principales: | , , , |
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| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
International Union of Crystallography
2024-11-01
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| Colección: | Journal of Synchrotron Radiation |
| Materias: | |
| Acceso en línea: | https://journals.iucr.org/paper?S1600577524009305 |
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