A new approach for ocular artifact removal from EEG signal using EEMD and SCICA
EEG data obtained from the scalp using the electrodes, usually gets contaminated by various artifacts like muscle artifact, line interference artifact, ocular artifact, and others. The Ocular artifact which is caused due to eye-blink or other eye movements, while measuring EEG is the most common and...
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| Autori principali: | , |
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| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
Taylor & Francis Group
2020-01-01
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| Serie: | Cogent Engineering |
| Soggetti: | |
| Accesso online: | http://dx.doi.org/10.1080/23311916.2020.1835146 |
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