Probing the Intrinsic Strain in Suspended Graphene Films Using Electron and Optical Microscopy

Abstract Quantifying the intrinsic properties of 2D materials is of paramount importance for advancing their applications. Large‐scale production of 2D materials merits the need for approaches that provide direct information about the role of growth substrate on 2D material properties. Transferring...

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Autores principales:	Kishan Thodkar, Milivoj Plodinec, Fabian Gramm, Karsten Kunze
Formato:	Artigo
Lenguaje:	Inglês
Publicado:	Wiley 2024-02-01
Colección:	Advanced Science
Materias:	chemical vapor deposition (CVD) electron backscatter diffraction (EBSD) Raman spectroscopy suspended graphene transmission electron microscopy (TEM)
Acceso en línea:	https://doi.org/10.1002/advs.202305366
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