The Extended Uncertainty Principle from a Projector-Valued Measurement Perspective
We revisit the Extended Uncertainty Principle (EUP) from an operational viewpoint, replacing wavefunction-based widths with apparatus-defined position constraints such as a finite slit of width <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mi mat...
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| Hovedforfatter: | |
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| Format: | Artigo |
| Sprog: | Inglês |
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MDPI AG
2025-09-01
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| Serier: | Foundations |
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| Online adgang: | https://www.mdpi.com/2673-9321/5/3/30 |
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