Application of Factorisation Methods to Analysis of Elemental Distribution Maps Acquired with a Full-Field XRF Imaging Spectrometer

The goal of the work was to investigate the possible application of factor analysis methods for processing X-ray Fluorescence (XRF) data acquired with a full-field XRF spectrometer employing a position-sensitive and energy-dispersive Gas Electron Multiplier (GEM) detector, which provides only limite...

ver descrição completa

Detalhes bibliográficos

Principais autores:	Bartłomiej Łach, Tomasz Fiutowski, Stefan Koperny, Paulina Krupska-Wolas, Marek Lankosz, Agata Mendys-Frodyma, Bartosz Mindur, Krzysztof Świentek, Piotr Wiącek, Paweł M. Wróbel, Władysław Dąbrowski
Formato:	Artigo
Idioma:	Inglês
Publicado em:	MDPI AG 2021-11-01
coleção:	Sensors
Assuntos:	XRF spectral imaging image processing micropattern gaseous detectors
Acesso em linha:	https://www.mdpi.com/1424-8220/21/23/7965
Tags:	Adicionar Tag Sem tags, seja o primeiro a adicionar uma tag!