Nanoscale rippling on polymer surfaces induced by AFM manipulation
Nanoscale rippling induced by an atomic force microscope (AFM) tip can be observed after performing one or many scans over the same area on a range of materials, namely ionic salts, metals, and semiconductors. However, it is for the case of polymer films that this phenomenon has been widely explored...
Kaydedildi:
| Asıl Yazarlar: | , , |
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| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
Beilstein-Institut
2015-12-01
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| Seri Bilgileri: | Beilstein Journal of Nanotechnology |
| Konular: | |
| Online Erişim: | https://doi.org/10.3762/bjnano.6.234 |
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