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FEM Studies of CMP Retainer Ring Using Metamodel

This study introduces a novel retainer ring design aimed at mitigating the edge effect during chemical mechanical planarization. The innovative design features an arch-shaped geometry that creates a bending effect, thereby reducing excessive pressure on the wafer's edge. A two-dimensional axisymmetr...

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Bibliográfalaš dieđut
Váldodahkkit: Do Yeong Jung, Seung Heon Lee, Jun Geon Park, Jae Phil Boo, Jung Woo Lee, Byoung Wan Kim, Gu Young Cho
Materiálatiipa: Artigo
Giella:Inglês
Almmustuhtton: Korean Society for Precision Engineering 2025-12-01
Ráidu:한국정밀공학회지
Fáttát:
Liŋkkat:http://www.jkspe.or.kr/upload/pdf/JKSPE-025-00007.pdf
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