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Microstructural Investigations of VO<sub>2</sub> Thermochromic Thin Films Grown by Pulsed Laser Deposition for Smart Windows Applications

The structural properties of VO<sub>2</sub> thin films, grown on either LSAT or Si substrates by pulsed laser deposition (PLD), are elucidated by means of transmission electron microscopy (TEM) methods. The TEM observations confirmed the successful growth of VO<sub>2</sub> by PLD in variable thickne...

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Uloženo v:
Hlavní autoři: Ayushi Rai, Nicusor Iacob, Aurel Leca, Claudiu Locovei, Victor Kuncser, Cristian N. Mihailescu, Andreas Delimitis
Médium: Artigo
Jazyk:Inglês
Vydáno: MDPI AG 2022-11-01
Edice:Inorganics
Témata:
thermochromic VO<sub>2</sub>
TEM/HRTEM
GPA
electron diffraction
structural defects
PLD
On-line přístup:https://www.mdpi.com/2304-6740/10/12/220
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