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Optical force microscopy: combining light with atomic force microscopy for nanomaterial identification

Scanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information. In this review, we discuss recent advances in scanning probe techniques that capitalize on light-induced fo...

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Principais autores: Jahan Nusrat, Wang Hanwei, Zhao Shensheng, Dutta Arkajit, Huang Hsuan-Kai, Zhao Yang, Chen Yun-Sheng
Format: Artigo
Sprog:Inglês
Udgivet: Wiley 2019-09-01
Serier:Nanophotonics
Fag:
atomic force microscopy (afm)
chirality
nanostructures
optical forces
polarization
structured light
Online adgang:https://doi.org/10.1515/nanoph-2019-0181
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