Generalizable image segmentation for microstructure characterization through integrated SEM and EBSD analysis

Abstract We demonstrate generalizable semantic segmentation using minimal ground truth data. Correlated scanning electron microscopy (SEM) images and electron backscatter diffraction (EBSD) measurements of friction-stir processed 316L stainless steel plates were used to train deep learning models fo...

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Principais autores:	M. F. N. Taufique, Julia Nguyen, Julian D. Escobar, Mayur Pole, David Garcia, Tianhao Wang, Hrishikesh Das, Kathy Nwe, David Brown, Kenneth Ross, Donald R. Todd, Erin Barker, Eric Smith, Keerti S. Kappagantula, Jenna A. Bilbrey
格式:	Artigo
语言:	Inglês
出版:	Nature Portfolio 2025-10-01
丛编:	npj Computational Materials
在线阅读:	https://doi.org/10.1038/s41524-025-01801-4
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