Probing Functional Thin Films with Grazing Incidence X-Ray Scattering: The Power of Indexing
Grazing incidence small- and wide-angle X-ray scattering (GISAXS, GIWAXS) has been widely applied for the study of functional thin films, be it for the characterization of nanostructured morphologies in block copolymers, nanocomposites, and nanoparticle assemblies, or for the packing and orientation...
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| 第一著者: | |
|---|---|
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
MDPI AG
2025-01-01
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| シリーズ: | Crystals |
| 主題: | |
| オンライン･アクセス: | https://www.mdpi.com/2073-4352/15/1/63 |
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