Bayesian Estimation of a Transmuted Topp-Leone Length Biased Exponential Model Based on Competing Risk with the Application of Electrical Appliances

Competing risk (<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msub><mi>C</mi><mi>o</mi></msub><mi>R</mi></mrow></semantics></math></inline-formula>) models are frequently disregarded in failure rate analysis, and traditional statistical approache...

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Principais autores:	Rania A. H. Mohamed, Ibrahim Elbatal, Ehab M. ALmetwally, Mohammed Elgarhy, Hisham M. Almongy
Formato:	Artigo
Idioma:	Inglês
Publicado em:	MDPI AG 2022-10-01
coleção:	Mathematics
Assuntos:	competing risk model transmuted Topp-Leone family Bayesian analysis simulation entropy
Acesso em linha:	https://www.mdpi.com/2227-7390/10/21/4042
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