Emitter-site specificity of hard x-ray photoelectron Kikuchi-diffraction
High-resolution full-field imaging of ( k _x , k _y ) photoelectron distributions ( k -resolution 0.03 Å ^−1 , angular resolution 0.03° at 6.7 keV) in a large field of view (up to 16 Å ^−1 dia.) allows to observe fine details in Kikuchi-type diffractograms. Alongside with the element specificity via...
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| Hauptverfasser: | , , , , , , , , , |
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| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
IOP Publishing
2020-01-01
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| Schriftenreihe: | New Journal of Physics |
| Schlagworte: | |
| Online-Zugang: | https://doi.org/10.1088/1367-2630/abb68b |
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