Reliability-Aware Microsystem Design; Compensation for an Ultra-Low-Power Current-Reuse LC-VCO
Aggressive technology scaling has led to a significant increase in manufacturing process variations and transistor aging effects, which critically degrade the performance of radio frequency (RF) circuits. These reliability challenges are particularly pronounced in voltage-controlled oscillators (VCO...
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| Главные авторы: | , |
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| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
MDPI AG
2026-06-01
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| Серии: | Micromachines |
| Предметы: | |
| Online-ссылка: | https://www.mdpi.com/2072-666X/17/6/713 |
| Метки: |
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