Effect of heating and bending on localized critical current in 2G HTS tapes with non-contact trapped field measurements
Current-voltage measurement (I–V curve) is a typical method to identify the critical current (Ic) of second-generation high-temperature superconducting tapes (2G HTS tapes). However, it is difficult to characterize the local Ic of 2G HTS tape on the millimeter (mm) scale due to the set spacing of th...
Sábháilte in:
| Príomhchruthaitheoirí: | , , , |
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| Formáid: | Artigo |
| Teanga: | Inglês |
| Foilsithe / Cruthaithe: |
Elsevier
2024-09-01
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| Sraith: | Journal of Materials Research and Technology |
| Ábhair: | |
| Rochtain ar líne: | http://www.sciencedirect.com/science/article/pii/S2238785424018398 |
| Clibeanna: |
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