Material Sensing with Spatial and Spectral Resolution Based on an Integrated Near-Infrared Spectral Sensor and a CMOS Camera

Measuring the composition of materials at a distance is a key requirement in industrial process monitoring, recycling, precision agriculture, and environmental monitoring. Spectral imaging in the visible or near-infrared (NIR) spectral bands provides a potential solution by combining spatial and spe...

Ausführliche Beschreibung

Bibliografische Detailangaben

Hauptverfasser:	Ben Delaney, Sjors Buntinx, Don M. J. van Elst, Anne van Klinken, René P. J. van Veldhoven, Andrea Fiore
Format:	Artigo
Sprache:	Inglês
Veröffentlicht:	MDPI AG 2025-05-01
Schriftenreihe:	Sensors
Schlagworte:	spectral sensing material classification near infrared integrated photonics
Online-Zugang:	https://www.mdpi.com/1424-8220/25/11/3295
Tags:	Tag hinzufügen Keine Tags, Fügen Sie das erste Tag hinzu!