An Integrated Solution to FIB-Induced Hydride Artifacts in Pure Zirconium

The preparation method of transmission electron microscopy (TEM) samples for pure zirconium was successfully executed using a focused ion beam (FIB) system. These samples unveiled artifact hydrides induced during the FIB sample preparation process, which resulted from stress damage, ion implantation...

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй

Үндсэн зохиолчид:	Yi Qiao, Zongwei Xu, Shilei Li, Fu Wang, Yubo Huang
Формат:	Artigo
Хэл сонгох:	Inglês
Хэвлэсэн:	MDPI AG 2024-08-01
Цуврал:	Micromachines
Нөхцлүүд:	focused ion beam (FIB) hydrides zirconium ion implantation
Онлайн хандалт:	https://www.mdpi.com/2072-666X/15/8/999
Шошгууд:	Шошго нэмэх Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!