Long-Term Analysis of Temperature and Current-Dependent Degradation in Green High-Power Light-Emitting Diodes

We report on the degradation dynamics and mechanisms of commercially available green high-power light-emitting diodes (LEDs) with a peak wavelength of 522 nm. The stress tests were carried out for up to 8800 hours with forward currents ranging from 350 mA to 1000 mA at junction temperatures between...

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Hlavní autoři:	Alexander Herzog, Matteo Buffolo, Francesco Piva, Simon Benkner, Babak Zandi, Jens Balasus, Paul Myland, Felix Wirth, Willem D. van Driel, Matteo Meneghini, Tran Quoc Khanh
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	IEEE 2025-01-01
Edice:	IEEE Access
Témata:	Light-emitting diode (LED) InGaN high-power LED reliability accelerated stress test green LEDs
On-line přístup:	https://ieeexplore.ieee.org/document/11127023/
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