Current-voltage plots reveal details of the energy level alignment during photoelectron spectroscopy experiments
The photoelectron current Is emitted from samples exposed to soft X-rays, such as is the case during X-ray photoelectron spectroscopy (XPS) analyses, is dominated by secondary electrons (SE) with energies not exceeding several eVs. Because of that, both the magnitude and the direction of Is is highl...
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| Format: | Artigo |
| Sprache: | Inglês |
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Elsevier
2024-12-01
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| Schriftenreihe: | Applied Surface Science Advances |
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| Online-Zugang: | http://www.sciencedirect.com/science/article/pii/S2666523924000710 |
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