Subband Signature Extraction for Fault Diagnosis ofAnalog VLSI Circuits
Abstract:An approach for diagnosing analog VLSI circuits based on Octave Haar wavelet was presented in order to lower the difficulty level of testing analog parametric fault. Sub-band filtering of testing response signal was accomplished by wavelet filter banks. The cross-correlation coefficient(CCC...
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| Formato: | Artigo |
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| Idioma: | Inglês |
| Publicado: |
Editorial Department of Journal of Sichuan University (Engineering Science Edition)
2007-01-01
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| Series: | 工程科学与技术 |
| Assuntos: | |
| Acceso en liña: | http://jsuese.scu.edu.cn/thesisDetails?columnId=44686434&Fpath=home&index=0 |
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