Curvature Detection with an Optoelectronic Measurement System Using a Self-Made Calibration Profile
So far, no studies of material deformations (e.g., bending of sports equipment) have been performed to measure the curvature (w″) using an optoelectronic measurement system OMS. To test the accuracy of the w″ measurement with an OMS (Qualisys), a calibration profile which allowed to: (i) differentia...
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| Главные авторы: | , , , , |
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| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
MDPI AG
2021-12-01
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| Серии: | Sensors |
| Предметы: | |
| Online-ссылка: | https://www.mdpi.com/1424-8220/22/1/51 |
| Метки: |
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