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Surrogate sensitivity analysis of facet optical coatings produced without and with in situ design reoptimization

Abstract Optoelectronic and photonic waveguide-based devices often require the control of the exit/entrance facet reflectance to a high degree of precision on a relatively large wavelength range. Fabricating facet optical coatings for that purpose can be challenging due to thickness errors. In this...

Ausführliche Beschreibung

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Bibliografische Detailangaben
Hauptverfasser: Daniel Poitras, Penghui Ma
Format: Artigo
Sprache:Inglês
Veröffentlicht: Nature Portfolio 2025-02-01
Schriftenreihe:Scientific Reports
Schlagworte:
Online-Zugang:https://doi.org/10.1038/s41598-025-89625-6
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