Rapid, non-destructive evaluation of ultrathin WSe2 using spectroscopic ellipsometry
The utilization of tungsten diselenide (WSe2) in electronic and optoelectronic devices depends on the ability to understand and control the process-property relationship during synthesis. We demonstrate that spectroscopic ellipsometry is an excellent technique for accurate, non-destructive determina...
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| Autors principals: | , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
AIP Publishing LLC
2014-09-01
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| Col·lecció: | APL Materials |
| Accés en línia: | http://dx.doi.org/10.1063/1.4893961 |
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