In Situ High-Pressure X-ray Diffraction and Raman Spectroscopy Study of Ti3C2T x MXene

Abstract The lattice stability and phonon response of Ti3C2T x MXene at high pressure are important for understanding its mechanical and thermal properties fully. Here, we use in situ high hydrostatic pressure X-ray diffraction (XRD) and Raman spectroscopy to study the lattice deformation and phonon...

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Bibliografiska uppgifter

Huvudupphov:	Luxi Zhang, Weitao Su, Yanwei Huang, He Li, Li Fu, Kaixin Song, Xiwei Huang, Jinhong Yu, Cheng-Te Lin
Materialtyp:	Artigo
Språk:	Inglês
Utgiven:	SpringerOpen 2018-10-01
Serie:	Nanoscale Research Letters
Ämnen:	Ti3C2T x MXene High-pressure XRD High-pressure Raman Grüneisen parameter
Länkar:	http://link.springer.com/article/10.1186/s11671-018-2746-4
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