Advances in VLSI testing at MultiGb per second rates

Today's high performance manufacturing of digital systems requires VLSI testing at speeds of multigigabits per second (multiGbps). Testing at Gbps needs high transfer rates among channels and functional units, and requires readdressing of data format and communication within a serial mode. This impl...

Cijeli opis

Bibliografski detalji

Glavni autor:	Topisirović Dragan
Format:	Artigo
Jezik:	Inglês
Izdano:	Faculty of Technical Sciences in Cacak 2005-01-01
Serija:	Serbian Journal of Electrical Engineering
Teme:	built in self test VLSI testing design for testability stuck-at fault MultiGbps
Online pristup:	http://www.doiserbia.nb.rs/img/doi/1451-4869/2005/1451-48690501043T.pdf
Oznake:	Dodaj oznaku Bez oznaka, Budi prvi tko označuje ovaj zapis!