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Development and Validation of Multi-Locus GWAS-Based KASP Markers for Maize <i>Ustilago maydis</i> Resistance

Corn smut, caused by <i>Ustilago maydis</i>, significantly threatens maize production. This study evaluated 199 maize inbred lines at the seedling stage under greenhouse conditions for resistance to <i>U. maydis</i>, identifying 39 highly resistant lines. A genome-wide association study (GWAS) using...

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Hoofdauteurs: Tao Shen, Huawei Gao, Chao Wang, Yunxiao Zheng, Weibin Song, Peng Hou, Liying Zhu, Yongfeng Zhao, Wei Song, Jinjie Guo
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: MDPI AG 2025-07-01
Reeks:Plants
Onderwerpen:
corn smut
disease index
candidate genes
haplotype combinations
marker-assisted selection
Online toegang:https://www.mdpi.com/2223-7747/14/15/2315
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