Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique

A novel, single shot, nondestructive scheme to measure the bunch length of submillimeter relativistic electron bunches using the electro-optical method is described. In this scheme, the birefringence induced by the electric field of the electrons converts the temporal characteristics of the bunch to...

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Detalhes bibliográficos

Principais autores:	T. Srinivasan-Rao, M. Amin, V. Castillo, D. M. Lazarus, D. Nikas, C. Ozben, Y. K. Semertzidis, A. Stillman, T. Tsang, L. Kowalski
Formato:	Artigo
Idioma:	Inglês
Publicado em:	American Physical Society 2002-04-01
coleção:	Physical Review Special Topics. Accelerators and Beams
Acesso em linha:	http://doi.org/10.1103/PhysRevSTAB.5.042801
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