Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

Noncontact atomic force microscopy (NC-AFM) is being increasingly used to measure the interaction force between an atomically sharp probe tip and surfaces of interest, as a function of the three spatial dimensions, with picometer and piconewton accuracy. Since the results of such measurements may be...

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Bibliografiske detaljer

Principais autores:	Mehmet Z. Baykara, Omur E. Dagdeviren, Todd C. Schwendemann, Harry Mönig, Eric I. Altman, Udo D. Schwarz
Format:	Artigo
Sprog:	Inglês
Udgivet:	Beilstein-Institut 2012-09-01
Serier:	Beilstein Journal of Nanotechnology
Fag:	atomic force microscopy force spectroscopy NC-AFM three-dimensional atomic force microscopy tip asymmetry tip elasticity
Online adgang:	https://doi.org/10.3762/bjnano.3.73
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