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Device Health Status Assessment Under the Influence of Multiple Exception Modes

Equipment reliability is the key feature to ensure the equipment operation for a long time. It is difficult to determine the overall reliability of industrial equipment due to the different reliability states of different subsystems. A device abnormality identification method based on JS (Jenson's S...

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書誌詳細
主要な著者: Xue-feng Yuan, Fei-long Liu, Yong-jun Qie, Shuai Sun, Jie Ren
フォーマット: Artigo
言語:Inglês
出版事項: The Prognostics and Health Management Society 2023-08-01
シリーズ:International Journal of Prognostics and Health Management
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オンライン・アクセス:https://papers.phmsociety.org/index.php/ijphm/article/view/3533
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