Comprehensive Modeling and Characterization of Photon Detection Efficiency and Jitter Tail in Advanced SPAD Devices

A new method to reliably simulate the PDE and jitter tail for realistic three-dimensional SPAD devices is presented. The simulation method is based on the use of electric field lines to mimic the carriers’ trajectories, and on one-dimensional models for avalanche breakdown probability and cha...

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Autors principals:	Remi Helleboid, Denis Rideau, Jeremy Grebot, Isobel Nicholson, Norbert Moussy, Olivier Saxod, Marie Basset, Antonin Zimmer, Bastien Mamdy, Dominique Golanski, Megan Agnew, Sara Pellegrini, Mathieu Sicre, Christel Buj, Guillaume Marchand, Jerome Saint-Martin, Marco Pala, Philippe Dollfus
Format:	Artigo
Idioma:	Inglês
Publicat:	IEEE 2022-01-01
Col·lecció:	IEEE Journal of the Electron Devices Society
Matèries:	Avalanche breakdown probability breakdown voltage jitter photon detection efficiency (PDE) single-photon avalanche diode (SPAD) technology computer-aided design (TCAD)
Accés en línia:	https://ieeexplore.ieee.org/document/9759481/
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