Impact of System‐Model Mismatch in Fourier Ptychographic Microscopy
Fourier ptychography microscope (FPM) is a computational imaging technique that can achieve a large field‐of‐view and high‐resolution retrieval of complex‐amplitude object function from a set of low‐resolution intensity images. This study investigates the effects of system‐model discrepancies in FP...
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| Principais autores: | , , , , |
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| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
Wiley-VCH
2025-12-01
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| Serier: | Advanced Photonics Research |
| Fag: | |
| Online adgang: | https://doi.org/10.1002/adpr.202500180 |
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