Thickness and surface profiling of optically transparent and reflecting samples using lens-less self-referencing digital holographic microscopy

Thickness and surface profiling of transparent/semi-transparent specimens are vital in various applications, including electronics, optics, healthcare, and biotechnology. Surface profiling techniques characterize and analyze surface thickness, morphology, and roughness. Developing easy-to-use, singl...

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Hlavní autoři:	Subhash Utadiya, Vismay Trivedi, Kevin Bhanderi, Mugdha Joglekar, Chaitanya Limberkar, Kireet Patel, Gyanendra Sheoran, Humberto Cabrera, Bahram Javidi, Arun Anand
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	Elsevier 2023-12-01
Edice:	Applied Surface Science Advances
Témata:	Digital holographic microscopy Quantitative phase imaging Surface profile Optical thickness
On-line přístup:	http://www.sciencedirect.com/science/article/pii/S2666523923001186
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