Reliability Test on Vienna Rectifier for Wide Bandgap Devices in EV Charging Systems

This study examines the reliability of several electronic components in a Vienna Rectifier configuration, which is a critical topology for power conversion systems. Component selection has become increasingly important over the past few years since the power electronics of today demand more efficien...

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй

Үндсэн зохиолчид:	Bharaneedharan Balasundaram, P. Suresh, Parvathy Rajendran, It Ee Lee, C. Ahamed Saleel
Формат:	Artigo
Хэл сонгох:	Inglês
Хэвлэсэн:	IEEE 2025-01-01
Цуврал:	IEEE Access
Нөхцлүүд:	Electric vehicles gallium nitride transistors silicon silicon carbide Vienna rectifier wide bandgap
Онлайн хандалт:	https://ieeexplore.ieee.org/document/10817574/
Шошгууд:	Шошго нэмэх Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!