Thickness conditions for characterizing the periodic nanostructures with the retrieved electromagnetic parameters
By analyzing the convergence of the retrieved effective electromagnetic parameters, we presented that one wavelength of the propagating wave in the nanostructure is the minimum thickness requirement for effectively characterizing a finite thickness nanostructure. This thickness condition has been se...
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| Hauptverfasser: | , , , , , |
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| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
EDP Sciences
2013-01-01
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| Schriftenreihe: | Journal of the European Optical Society-Rapid Publications |
| Schlagworte: | |
| Online-Zugang: | https://jeos.edpsciences.org/articles/jeos/pdf/2013/01/jeos20130813028.pdf |
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