High resolution strain measurements in highly disordered materials
The ability to measure small deformations or strains is useful for understanding many aspects of materials. Here, an alternate analysis of speckle x-ray diffraction peaks is presented in which the systematic shifts of the speckles are analyzed allowing for strain (or flow) patterns to be inferred. T...
Αποθηκεύτηκε σε:
| Κύριοι συγγραφείς: | , , , |
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| Μορφή: | Artigo |
| Γλώσσα: | Inglês |
| Έκδοση: |
American Physical Society
2021-02-01
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| Σειρά: | Physical Review Research |
| Διαθέσιμο Online: | http://doi.org/10.1103/PhysRevResearch.3.013119 |
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