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DeFRCN-MAM: DeFRCN and multi-scale attention mechanism-based industrial defect detection method

With the technology development, industrial defect detection based on deep learning has attracted extensive attention in the academic community. Different from general visual objects, industrial defects have the characteristics of small sample, weak visibility and irregular shape, which hinder the a...

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Detaylı Bibliyografya
Asıl Yazarlar: Tong Zheng, Liangbing Sa, Chongchong Yu, Aibin Song
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: Taylor & Francis Group 2024-12-01
Seri Bilgileri:Applied Artificial Intelligence
Online Erişim:https://www.tandfonline.com/doi/10.1080/08839514.2024.2349981
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