A Detection Algorithm for Surface Defects of Printed Circuit Board Based on Improved YOLOv8

Improving detection accuracy is a challenging task when detecting defects in PCBs. To conquer the issue of degradation of recognition performance of existing intelligent detection algorithms in different environments, we present an improved algorithm, IEMA-YOLOv8, based on YOLOv8. First, we design a...

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Λεπτομέρειες βιβλιογραφικής εγγραφής

Κύριοι συγγραφείς:	Lei Yao, Bing Zhao, Xihui Wang, Sihan Mei, Yulun Chi
Μορφή:	Artigo
Γλώσσα:	Inglês
Έκδοση:	IEEE 2024-01-01
Σειρά:	IEEE Access
Θέματα:	PCB defects detection YOLOv8 attention mechanism SPPELAN loss function
Διαθέσιμο Online:	https://ieeexplore.ieee.org/document/10752944/
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