Identification of genetic loci for flag-leaf-related traits in wheat (Triticum aestivum L.) and their effects on grain yield

Flag-leaf-related traits including length (FLL), width (FLW), area (FLA), thickness (FLT), and volume (FLV) of flag leaves are the most important determinants of plant architecture and yield in wheat. Understanding the genetic basis of these traits could accelerate the breeding of high yield wheat v...

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Ngā kaituhi matua:	Ying Wang, Ling Qiao, Chenkang Yang, Xiaohua Li, Jiajia Zhao, Bangbang Wu, Xingwei Zheng, Pengbo Li, Jun Zheng
Hōputu:	Artigo
Reo:	Inglês
I whakaputaina:	Frontiers Media S.A. 2022-09-01
Rangatū:	Frontiers in Plant Science
Ngā marau:	wheat flag leaf flag leaf volume measurement quantitative trait loci grain
Urunga tuihono:	https://www.frontiersin.org/articles/10.3389/fpls.2022.990287/full
Ngā Tūtohu:	Tāpirihia he Tūtohu Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!