Quantitative Accelerated Life Testing of MEMS Accelerometers
Quantitative Accelerated Life Testing (QALT) is a solution for assessing thereliability of Micro Electro Mechanical Systems (MEMS). A procedure for QALT is shownin this paper and an attempt to assess the reliability level for a batch of MEMSaccelerometers is reported. The testing plan is application...
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| Autors principals: | , , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
MDPI AG
2007-11-01
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| Col·lecció: | Sensors |
| Matèries: | |
| Accés en línia: | http://www.mdpi.com/1424-8220/7/11/2846/ |
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